VK-X3000 3D Surface Profiler Introduction

This document introduces the KEYENCE VK-X3000 3D Surface Profiler, which combines focus variation, laser confocal scanning, and white light interferometry in a single device for high-precision observation and measurement of any target. It enables profile, roughness, film thickness, and 2D/3D surface analysis with adaptive lighting, true-color imaging, and magnification up to 28,800x, supporting automatic comparison across 42 roughness parameters.