AFDD S-ARC1 Indications and Test Sequences

This document describes the operational test sequences and fault indication patterns for the AFDD (Arc Fault Detection Device) S-ARC1, including blink rates for different fault conditions such as overvoltage (U > 275 V), residual current (I∆ > I∆n), and internal self-test failure. It also covers the configuration of the device with ON/OFF states, terminal connections (1/2, 2/1, N), and distinguishes between the AFDD S-ARC1 and the RCD-only DS-ARC1 variant.