VK-X3000 Series 3D Surface Profiler Brochure

This document describes the Keyence VK-X3000 Series 3D Surface Profiler, which uses a triple scan approach combining laser confocal, focus variation, and white light interferometry to measure targets from nanometers to millimeters. It highlights an all-in-one measurement system with 292 analysis tools, batch processing, and templating for in-depth surface analysis beyond simple height and dimension measurement.