VL Series and XM Series 3D Measurement Systems Comparison
This document compares two types of 3D measurement systems: the Non-Contact VL Series, which captures entire surface shapes for rapid analysis and comparison to CAD data, and the Contact XM Series, which functions like a coordinate measuring machine for precise dimensional and GD&T measurements of complex geometries. It highlights applications such as free-form surface scanning, profile measurement, and in-process verification for manufacturing.
Failed to load PDF
Download insteadYou might also like
IV Series Polarizing Filter Attachments Instruction Manual
2 pages
Logistics Line Optimization and Cost Reduction Techniques
8 pages
DL-RB1A BCD Output Unit Manual
40 pages
Traceability System Development Guide
6 pages
LS-7000 Series Digital Micrometer User's Manual
192 pages
Stable Laser Displacement Measurement on Varying-Reflectivity Targets
5 pages
CL-3000 Series Confocal Displacement Sensor Brochure
12 pages
VHX Series Digital Microscope Food and Pharmaceutical Application Guide
12 pages
CA-DQP(X) Series Pattern Projection Light Instruction Manual
4 pages
96M15007 Assembly Procedure
1 pages