VK-X250/X150/X120 3D Laser Scanning Confocal Microscope Brochure

This document describes the Keyence VK-X250/X150/X120 series 3D laser scanning confocal microscope, highlighting its industry-leading accuracy, high-resolution 3D color imaging, and non-destructive profile and roughness measurement capabilities. It compares the system favorably against conventional equipment like SEM, optical microscopes, roughness gauges, and interferometers, emphasizing advantages such as no sample preparation, large depth-of-field, measurement traceability to NIST and AIST standards, and the ability to measure samples of any size and material.